YIN, L.; BEZIRHAN, U.; VON DAVIER, M. Improving Context Scale Interpretation Using Latent Class Analysis for Cut Scores. International Electronic Journal of Elementary Education, [S. l.], v. 17, n. 2, p. 279–288, 2025. Disponível em: https://iejee.com/index.php/IEJEE/article/view/2435. Acesso em: 31 mar. 2025.